# Jeol Launches Haxis Microscope for Semiconductors

> Jeol begins sales of HAXIS low-angle ion milling SEM for semiconductor failure analysis.
- Title: Jeol Launches Haxis Microscope for Semiconductors | Shortify
- Summary: Jeol begins sales of HAXIS low-angle ion milling SEM for semiconductor failure analysis. Jeol will sell HAXIS, a new low-angle ion milling scanning electron…
- Keywords: jeol, haxis, semiconductor, failure analysis, low angle ion milling, scanning electron microscope, semiconductor devices, ion milling, pvc observation, qtat failure analysis, money, business
- Source: Financialpost — https://financialpost.com/pmn/business-wire-news-releases-pmn/jeol-sales-launch-of-haxis-the-new-low-angle-ion-milling-scanning-electron-microscope
- Read time: 1 min
- Topics: jeol, haxis, semiconductor, failure analysis, low angle ion milling, scanning electron microscope, semiconductor devices, ion milling, pvc observation, qtat failure analysis, money, business
## HAXIS Launch Announcement
Jeol Ltd. (President & CEO Izumi Oi) announces the development of its new low‑angle ion‑milling scanning electron microscope, HAXIS, and will commence sales on October 5, 2026.
## Semiconductor Analysis Challenge
As advanced semiconductor device structures shrink and grow more complex, it has become difficult to contact and measure microscale circuits using nano-manipulators without affecting the analysis target.
## HAXIS Technology
HAXIS combines passive voltage contrast detection technology with low-angle ion milling to enable clear, highly reproducible observation of advanced semiconductors.
## Key Benefits
The use of argon ensures stable surface quality, reduces running costs, and minimizes processing damage and contamination during semiconductor failure analysis.
## LIM Delayering Technique
HAXIS uses a unique low-angle ion milling technique to create a flat surface with minimal damage, enabling clear and highly reproducible passive voltage contrast observation.
## Sales Target
Jeol targets 15 units per year for HAXIS, starting sales on October 5, 2026, to support rapid semiconductor failure analysis.
## Key takeaway

Jeol will sell HAXIS, a new low-angle ion milling scanning electron microscope, starting October 5, 2026, to improve semiconductor defect analysis.